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Evaluation of small scattering defects densities by laser scattering tomography: application to levitated glasses

Published online by Cambridge University Press:  15 July 2004

P. Gall-Borrut ,
D. Perret ,
B. Drevet ,
P. Falgayrettes ,
L. Nativel  and
M. Castagne
P. Gall-Borrut*
Affiliation:
Centre d'Électronique et de Micro-optoelectronique de Montpellier, Université Montpellier II, Place E. Bataillon, 34095 Montpellier Cedex 5, France
D. Perret
Affiliation:
Commissariat à l'Énergie Atomique, Centre de Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
B. Drevet
Affiliation:
Commissariat à l'Énergie Atomique, Centre de Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
P. Falgayrettes
Affiliation:
Centre d'Électronique et de Micro-optoelectronique de Montpellier, Université Montpellier II, Place E. Bataillon, 34095 Montpellier Cedex 5, France
L. Nativel
Affiliation:
Centre d'Électronique et de Micro-optoelectronique de Montpellier, Université Montpellier II, Place E. Bataillon, 34095 Montpellier Cedex 5, France
M. Castagne
Affiliation:
Centre d'Électronique et de Micro-optoelectronique de Montpellier, Université Montpellier II, Place E. Bataillon, 34095 Montpellier Cedex 5, France
*
gall@cem2.univ-montp2.fr
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Abstract

A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is adapted to the characterization of materials containing scattering defects ranging from 1 to 102/mm3. The technique makes it possible to obtain good resolution within a volume chosen to contain a statistically significant defect density. This method is used to show that the gas levitation technique makes it possible to significantly decrease scattering defects in glasses. In parallel, individual study of defects in such glasses is also presented.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 27 , Issue 1-3: Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X) , July 2004 , pp. 399 - 401
Copyright
© EDP Sciences, 2004

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References

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