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Transmission Electron Microscopy Study of YBa2Cu3O7-x Thin Film Multilayer Devices

Published online by Cambridge University Press:  15 February 2011

M. A. Barnett ,
J. S. Abell ,
M. Aindow ,
N. G. Chew ,
P. J. Hirst  and
R. G. Humphreys
M. A. Barnett
Affiliation:
School of Metallurgy and Materials, Superconductivity Research Group, The University of Birmingham, Edgbaston, BIRMINGHAM, UK, B15 2TT
J. S. Abell
Affiliation:
School of Metallurgy and Materials, Superconductivity Research Group, The University of Birmingham, Edgbaston, BIRMINGHAM, UK, B15 2TT
M. Aindow
Affiliation:
School of Metallurgy and Materials, Superconductivity Research Group, The University of Birmingham, Edgbaston, BIRMINGHAM, UK, B15 2TT
N. G. Chew
Affiliation:
School of Metallurgy and Materials, Superconductivity Research Group, The University of Birmingham, Edgbaston, BIRMINGHAM, UK, B15 2TT
P. J. Hirst
Affiliation:
Defence Research Agency, St Andrews Road, MALVERN, Worcs, UK, WR14 3PS
R. G. Humphreys
Affiliation:
Defence Research Agency, St Andrews Road, MALVERN, Worcs, UK, WR14 3PS
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Abstract

Patterned thin film multilayer structures, consisting of superconducting YBa2Cu3O7-x (YBCO) and insulating PrBa2Cu3O7-x (PrBCO), deposited onto (001) MgO substrates by electron beam co-evaporation, have been examined using Transmission Electron Microscopy (TEM). It is shown that PrBCO films grown over 30° steps in YBCO layers are free of tilt-grain boundaries. The PrBCO is c-oriented everywhere and shows pronounced faceting on the steps. Strain contrast features are present where the PrBCO has to adapt to large variations in the slope angle of the underlying YBCO layer. However, tilt-grain boundaries in YBCO or PrBCO layers are nucleated when depositing over small MgO steps formed by unintentional milling into the substrate. It is shown that grain boundaries associated with milled steps on MgO can be eliminated by the use of a PrBCO buffer layer beneath the superconducting base layer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 474: Symposium L – Epitaxial Oxide Thin Films III , 1997 , 107
Copyright
Copyright © Materials Research Society 1997

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References

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