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Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films

Published online by Cambridge University Press:  04 August 2017

Jim Fitch ,
Robbyn Trappen ,
Chih-Yeh Huang ,
Jinling Zhou ,
Guerau Cabrera ,
Shuai Dong ,
Shalini Kumari ,
Mikel B. Holcomb  and
James M. LeBeau
Jim Fitch
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NCUSA
Robbyn Trappen
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WVUSA
Chih-Yeh Huang
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WVUSA
Jinling Zhou
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WVUSA
Guerau Cabrera
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WVUSA
Shuai Dong
Affiliation:
Department of Physics, Southeast University, Nanjing, China
Shalini Kumari
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WVUSA
Mikel B. Holcomb
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WVUSA
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NCUSA

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1600 - 1601
Copyright
© Microscopy Society of America 2017 

References

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[9] This work is supported by the National Science Foundation (DMR-1608656). The authors also acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation..Google Scholar