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An Optimized Solution for Cryo Electron Tomography

Published online by Cambridge University Press:  31 July 2006

W Voorhout ,
F De Haas ,
P Frederik ,
R Schoenmakers ,
W Busing  and
D Hubert
W Voorhout
Affiliation:
FEI Company
F De Haas
Affiliation:
FEI Company
P Frederik
Affiliation:
Maastricht University
R Schoenmakers
Affiliation:
FEI Company
W Busing
Affiliation:
FEI Company
D Hubert
Affiliation:
FEI Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1110 - 1111
Copyright
© 2006 Microscopy Society of America