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Spatially Resolved Local Atomic Structure from Exelfs

Published online by Cambridge University Press:  21 February 2011

E. A. Stern ,
M. Qian  and
M. Sarikaya
E. A. Stern
Affiliation:
Departments of Physics, University of Washington, Seattle, WA 98115, USA
M. Qian
Affiliation:
Materials Science and Engineering, University of Washington, Seattle, WA 98115, USA
M. Sarikaya
Affiliation:
Materials Science and Engineering, University of Washington, Seattle, WA 98115, USA
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Abstract

EXELFS, extended energy loss fine structure, is one of the spectroscopic techniques provided by electron energy loss spectrometer in the transmission electron microscope. Here, EXELFS is described for its potential use for determining nanoscale physical properties of complex materials. It is demonstrated that EXELFS analysis, like EXAFS, extended X-ray absorption fine structure in bulk materials, provides short-range structural information such as atomic nearest-neighbors and their distances in amorphous an crystalline samples. Some of the problems that hindered the development and wide use of EXELFS were discussed and their solutions are presented. Further solutions and future prospects are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 3
Copyright
Copyright © Materials Research Society 1994

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References

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