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Non-Destructive Surface Analysis of Materials by MeV Ion Beams, Microscopy and Computer Simulation

Published online by Cambridge University Press:  14 March 2016

J. Pacheco de Carvalho ,
C. F. R. Pacheco  and
A. D. Reis
J. Pacheco de Carvalho
Affiliation:
Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal. Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal.
C. F. R. Pacheco
Affiliation:
Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal.
A. D. Reis
Affiliation:
Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal. Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal.

Abstract

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Type
Material Sciences
Information
Microscopy and Microanalysis , Volume 22 , Issue S4: 4th Joint Congress of the Portuguese and Spanish Microscopy Societies: mfs2015 - Microscopy at the Frontiers of Science , March 2016 , pp. 42 - 43
Copyright
Copyright © Microscopy Society of America 2016 

References

[1] “Handbook of Modern Ion Beam Materials Analysis”, ed. J.R. Tesmer, M. Nastasi (Materials Research Society, Pittsburgh, PA) 1995.Google Scholar
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[3]Calvert, J. M., et al, J. Phys. D: Appl. Phys 7 (1974). p. 940.CrossRefGoogle Scholar
[4]Pacheco de Carvalho, J. A. R. & Reis, A. D., Bol. Soc. Esp. Ceram 47(4 (2008). p. 252.CrossRefGoogle Scholar
[5]Pacheco de Carvalho, J. A. R., et al, Nucl. Instr. and Meth. B 269(24 (2011). p. 3054.CrossRefGoogle Scholar
[6]Pacheco de Carvalho, J., et al, Microsc. Microanal 19(S4 (2013). p. 133.Google Scholar
[7]Barradas, N.P., et al, Nucl. Instr. and Meth. B 262 (2007). p. 281.Google Scholar
[8] Supports from Universidade da Beira Interior and FCT (Fundação para a Ciência e Tecnologia) /PEst-OE-FIS/UI0524/2014 (Projecto Estratégico-UI524-2014) are acknowledged.Google Scholar