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The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques

Published online by Cambridge University Press:  04 August 2017

J.-L. Rouviere ,
B. Haas ,
E. Robin ,
D. Cooper ,
N. Bernier  and
M. Williamson
J.-L. Rouviere
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, INAC/MEM/LEMMA, 17 rue des Martyrs, 38054 Grenoble, France.
B. Haas
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, INAC/MEM/LEMMA, 17 rue des Martyrs, 38054 Grenoble, France.
E. Robin
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, INAC/MEM/LEMMA, 17 rue des Martyrs, 38054 Grenoble, France.
D. Cooper
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble, France
N. Bernier
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble, France
M. Williamson
Affiliation:
Thermo Fisher Scientific (formerly FEI Company), Eindhoven, Netherlands

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1414 - 1415
Copyright
© Microscopy Society of America 2017 

References

[1] Rouviere, J.L., et al. FCMN conference proceeding (2015) p. 38 (available at www.nist.gov).Google Scholar
[2] Cooper, D., et al., Micron 80, 145 2016.Google Scholar
[3] Robin, E. US patent 2016 0169668, A1.Google Scholar
[4] Rueda-Fonseca, P., Robin, E., et al., Nano Lett. 16, 1637 2016). p. 1637.Google Scholar
[5] Haas, B., et al EMC conf. proc, Lyon 28 August - 2 September, (2016).Google Scholar