Hostname: page-component-76fb5796d-wq484 Total loading time: 0 Render date: 2024-04-26T17:32:11.891Z Has data issue: false hasContentIssue false

Glass as dielectric for high temperature power capacitors

Published online by Cambridge University Press:  16 December 2014

Timothy J Patey
Affiliation:
ABB Corporate Research, Segelhofstrasse 1K, CH-5405 Baden-Dättwil, Switzerland.
Christoph Schlegel
Affiliation:
ABB Corporate Research, Segelhofstrasse 1K, CH-5405 Baden-Dättwil, Switzerland.
Emmanuel Logakis
Affiliation:
ABB Corporate Research, Segelhofstrasse 1K, CH-5405 Baden-Dättwil, Switzerland.
Get access

Abstract

Modern polypropylene film power capacitors are state of the art for power factor correction and many DC link applications, but their long-term commercial use is limited to temperatures of less than 85°C. The temperature limit is given by the dielectric polypropylene which has a melting point in the range of 140 to 170°C, while glass is much higher. Thus, the temperature limit could potentially be overcome by use of thin, alkali-free glass as dielectric. “Glass capacitors” employing ultra-thin and high purity glass layers are promising devices for high temperature applications in oil, gas, aerospace, hybrid electric vehicles, DC transmission, and pulsed power systems. This includes emerging power electronic systems using silicon carbide switches and diodes.

This work analyzes and compares various glasses with a thickness of less than 50 µm by dielectric spectroscopy and elemental analysis. It is demonstrated that glass is attractive as dielectric for a wide frequency range up to 200°C. It argues that the dielectric losses are currently too great for thin glass to be used within a commercial power capacitor.

While high temperature prototypes already exist, we demonstrate through our analysis that further developments are required to integrate this promising device into commercial systems. It is seen that even trace amounts of alkali materials can have an impact on losses. These losses must be further reduced through fundamental research into polarization/conduction mechanisms of various glass components.

Type
Articles
Copyright
Copyright © Materials Research Society 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Ho, J. and Jow, R., “Characterization of High Temperature Polymer Thin Films for Power Conditioning Capacitors”, Army Research Lab, Adelphi, (2009).Google Scholar
Shirn, G.A. and Burn, I., Proc. Symp. high-energy-density capacitors dielectric mater., p. 4966, (1981).Google Scholar
Schneuwly, A., Groning, P., Schlapback, L., Irrgang, C., and Vogt, J., IEEE transactions on dielectrics and electrical insulation, 5, p. 862–8, (1998).10.1109/94.740768CrossRefGoogle Scholar
Smith, N.J., Rangarajan, B., Lanagan, M.T., and Pantano, C.G., Mater. Lett., 63, 12451248, (2009).10.1016/j.matlet.2009.02.047CrossRefGoogle Scholar
Murata, T., Dash, P., Furman, E., and Pantano, C., J. Am. Ceram. Soc., 95(6), 19151919 (2012).10.1111/j.1551-2916.2012.05215.xCrossRefGoogle Scholar
Manoharan, M. P., Zou, C., Furman, E., Zhang, N., Kushner, D.I., Zhang, S., Murata, T., and Lanagan, M.T., Energy Tech., 1, 313318, (2013).10.1002/ente.201300031CrossRefGoogle Scholar
Logakis, E., Petersson, L., and Viertel, J., 2013 IEEE International Conference on Solid Dielectrics, Bologna, Italy, June 30 – July 4, (2013).Google Scholar