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FIB Preparation of Bone-Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography

Published online by Cambridge University Press:  27 August 2014

Julia Huang ,
Xiaoyue Wang  and
Kathryn Grandfield
Julia Huang
Affiliation:
Canadian Centre for Electron Microscopy, Brockhouse Institute for Materials Research, McMaster University, Hamilton, Canada
Xiaoyue Wang
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, Canada
Kathryn Grandfield
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 352 - 353
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Brånemark, P-I, et al Scand J Plast Reconstr Surg 3 (1969), p. 81.Google Scholar
[2] Grandfield, K, Palmquist, A and Engqvist, H Philos Trans R Soc A 370 (2012), p. 1337.Google Scholar
[3] Midgley, PA and Dunin-Borkowski, RE Nature Materials 8 (2009), p. 271.Google Scholar
[4] The electron and ion microscopy work described in this paper was performed at the Canadian Centre for Electron Microscopy at McMaster University; a facility supported by NSERC and other government agencies.Google Scholar