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Improving Diamond Device Performances for Pulsed Mode Detection

Published online by Cambridge University Press:  01 February 2011

Hassen Hamrita
Affiliation:
Commissariat Energie Atomique (CEA-LIST), DRT, CEA-LIST, Gif-sur-Yvette, 91191, France, 33-1-6908-4053, 33-1-6908-7679
Dominique Tromson
Affiliation:
dominique.tromson@cea.fr, CEA/Saclay, LIST (CEA-Recherche Technologique)/DETECS/SSTM, Gif-sur-Yvette, 91191, France
Caroline Descamps
Affiliation:
caroline.descamps@cea.fr, CEA/Saclay, LIST (CEA-Recherche Technologique)/DETECS/SSTM, Gif-sur-Yvette, 91191, France
Christine Mer
Affiliation:
christine.mer@cea.fr, CEA/Saclay, LIST (CEA-Recherche Technologique)/DETECS/SSTM, Gif-sur-Yvette, 91191, France
Milos Nesladek
Affiliation:
milos.nesladek@cea.fr, CEA/Saclay, LIST (CEA-Recherche Technologique)/DETECS/SSTM, Gif-sur-Yvette, 91191, France
Philippe Bergonzo
Affiliation:
philippe.bergonzo@cea.fr, CEA/Saclay, LIST (CEA-Recherche Technologique)/DETECS/SSTM, Gif-sur-Yvette, 91191, France
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Abstract

CVD diamond combines attractive properties for the fabrication of detection devices operating in specific environments. One inherent problem however with diamond is the presence of defect levels that are altering the detection characteristics. They result in unstable responses and carrier losses. One of the issues can be to operate the devices in the pulsed mode regime, when transitory effects are less impacted by defective levels evolution than for steady state currents. This therefore implies the use of materials that are faster, but also of lower carrier lifetime, and therefore generally agreed to be of poorer quality. This has therefore to be compromised with respect to the desired performances.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

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