Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-26T17:57:53.033Z Has data issue: false hasContentIssue false

Integrated Pyroelectric Infrared Sensor Using Pvdf thin Film Deposited by Electro-Spray Method

Published online by Cambridge University Press:  21 February 2011

Ryouji Asahi
Affiliation:
Toyota Central Research and Development Laboratories, Inc. Nagakute-cho, Aichi-gun, Aichi-ken, 480-11, Japan
Jiro Sakata
Affiliation:
Toyota Central Research and Development Laboratories, Inc. Nagakute-cho, Aichi-gun, Aichi-ken, 480-11, Japan
Osamu Tabata
Affiliation:
Toyota Central Research and Development Laboratories, Inc. Nagakute-cho, Aichi-gun, Aichi-ken, 480-11, Japan
Midori Mochizuki
Affiliation:
Toyota Central Research and Development Laboratories, Inc. Nagakute-cho, Aichi-gun, Aichi-ken, 480-11, Japan
Susumu Sugiyama
Affiliation:
Toyota Central Research and Development Laboratories, Inc. Nagakute-cho, Aichi-gun, Aichi-ken, 480-11, Japan
Yasunori Taga
Affiliation:
Toyota Central Research and Development Laboratories, Inc. Nagakute-cho, Aichi-gun, Aichi-ken, 480-11, Japan
Get access

Abstract

A pyroelectric infrared sensor using a poly(vinylidene fluoride) (PVDF) thin film has been integrated with a read-out circuit on a silicon substrate. The PVDF thin film with a thickness of 1-2 µm was deposited on the sensing area by an electro-spray (ESP) method. A form I crystal and a large pyroelectric coefficient of 4 nCcm−2K−1 were observed just after the deposition without any poling treatments. The fabrication process of the sensor was based on a standard MOS LSI process and a polysilicon sacrificial layer etching technique. In order to reduce the heat capacitance and the thermal conduction, the PVDF thin film was supported on a thin Si3N4 membrane structure formed by etching a part of the silicon substrate under the sensing area. The sensor with a sensing area of 400x400 µm2 had a responsivity of 98 V/W, a detectivity of l.4× 107 cmHz1/2W−1, an NEP of 2.9× 10−99 Hz1/2W at a frequency of 100 Hz and a time constant of 1.3 msec.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Watton, R. et al. , SPIE 510 Infrared Technology X, 139 (1984).Google Scholar
2. Qkuyama, M. et al. , Tech. Digest of Transducers'87 (1987).Google Scholar
3. Tomita, Y. et al. , Tech. Digest of the 8th Sensor Symp., 59 (1989).Google Scholar
4. Okuyama, M. et al. , Jpn. J. Appl. Phy. Suppl. 21, 1 (1982).Google Scholar
5. Ye, C. et al. , Sensors and Actuators A, 35, 77 (1992).CrossRefGoogle Scholar
6. Cheeks, T. L. et al. , J. Vac. Sci. Technol. 5 (4), Jun/Aug. 1917 (1987).CrossRefGoogle Scholar
7. Lovinger, A. J., Jpn. J. Appl. Phy. Suppl. 24, 2 (1985).Google Scholar
8. Munch, W. V. et al. , Sensors and Actuators A, 25–27, 167 (1991).Google Scholar
9. Hammes, P. C. A. et al. , Sensors and Actuators A, 32, 396 (1992).CrossRefGoogle Scholar
10. Lee, A. et al. , Thin Solid Films. 181, 245 (1989).CrossRefGoogle Scholar
11. Sakata, J. et al. , Thin Solid Films, 195, 175 (1991).CrossRefGoogle Scholar
12. Takahashi, T. et al. , Appl. Phy. Lett. 37 (9), 1 Nov, 791 (1980).CrossRefGoogle Scholar
13. Suzuki, M. et al. , Tech. Digest of the 9th Sensor Symp., 71 (1990).Google Scholar
14. Tabata, O. et al. , Proc. of the 2nd Int. Symp. on Micro Machine and Human Science, 163 (1991).Google Scholar