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Correlation of Etch Pits and Dislocations in As-grown and Thermal-Cycle-Annealed HgCdTe(211) Films

Published online by Cambridge University Press:  04 August 2017

Majid. Vaghayenegar ,
R. N. Jacobs ,
J. D. Benson ,
A. J. Stoltz ,
L. A. Almeida  and
David. J. Smith
Majid. Vaghayenegar
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287
R. N. Jacobs
Affiliation:
U.S. Army RDECOM, CERDEC Night Vision and Electronic Sensors Directorate, Fort Belvoir, VA 22060
J. D. Benson
Affiliation:
U.S. Army RDECOM, CERDEC Night Vision and Electronic Sensors Directorate, Fort Belvoir, VA 22060
A. J. Stoltz
Affiliation:
U.S. Army RDECOM, CERDEC Night Vision and Electronic Sensors Directorate, Fort Belvoir, VA 22060
L. A. Almeida
Affiliation:
U.S. Army RDECOM, CERDEC Night Vision and Electronic Sensors Directorate, Fort Belvoir, VA 22060
David. J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1526 - 1527
Copyright
© Microscopy Society of America 2017 

References

[1] Rogalski, A., Antoszewski, J. & Faraone, L. J. Appl. Phys. 105 2009 091101.Google Scholar
[2] Wijewarnasuriya, P., et al, J. Electron. Mater. 39 2010 1110.Google Scholar
[3] Vaghayenegar, M., et al J. Electron. Mater. under review.Google Scholar
[4] This work was supported by Army Research Office Grant #63749-EL. We gratefully acknowledge the use of facilities within the John M. Cowley Center for HREM at Arizona State University..Google Scholar