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Nanomechanical Imaging Of Multi-Walled Carbon Nanotubes

Published online by Cambridge University Press:  10 February 2011

Lata Muthuswami
Affiliation:
School of NanoSciences and NanoEngineering, University at Albany, Albany, NY 12203, U.S.A.
P. M. Ajayan
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY, 12180, U.S. A.
R. E. Geer
Affiliation:
School of NanoSciences and NanoEngineering, University at Albany, Albany, NY 12203, U.S.A.
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Abstract

Nanomechanical mapping of individual multi-walled carbon nanotubes (MWNTs) has been undertaken to investigate intra-tube variations of mechanical response. Ultrasonic force microscopy has been used to measure the relative axial and radial variations of contact stiffness of individual MWNTs synthesized using chemical vapor deposition (CVD) and arc-discharge (AD) techniques. For CVD-based MWNTs the contact stiffness of the tube was seen to vary strongly across volume defects (axial variation of the tube radius) and is assumed to result from the high crystalline defect density associated with such radial variations. These observations support recent experimental data of effective Young's modulus inferred from electrostatically-induced nanotube vibration amplitudes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

1. Iijima, S., 354, 56 (1991).Google Scholar
2. Treacy, M.M., Ebbesen, T. W., and Gibson, J. M., Nature 381, 678 (1996).Google Scholar
3. Yao, N. and Lordi, V., J. Appl. Phys. 84, 1939 (1998).Google Scholar
4. Wong, E.W., Sheehan, P. E., and Lieber, C.M., Science 277, 1971 (1997).Google Scholar
5. Akita, S., Nishijima, H., Kishida, T., and Nakayama, Y., Jpn. J. Appl. Phys. 39, 3724 (2000).Google Scholar
6. Gao, R., Wang, Z.L., Bai, Z., deHeer, W.A., Dai, L., Gao, M., Phys. Rev. Lett. 85, 622 (2000).Google Scholar
7. Shekhawat, G. S., Kolosov, O.V., Briggs, G., and Geer, R. E., J. of Appl. Phys., 91, 4549 (2002).Google Scholar
8. Kolosov, O. V., Castell, M.R., Marsh, C. D., Briggs, G. A. D., Kamins, T. I., and Williams, R. S., Phys. Rev. Lett. 81, 1046 (1998).Google Scholar
9. Hertel, T., Walkup, R.E., and Avouris, P., Phys. Rev. B, 58, 13, 870 (1998).Google Scholar