Hostname: page-component-76fb5796d-45l2p Total loading time: 0 Render date: 2024-04-27T02:10:04.027Z Has data issue: false hasContentIssue false

Ni-Mn-Ga films in the austenite and the martensite structures at room temperature: Uniaxial texturation and epitaxial growth

Published online by Cambridge University Press:  31 January 2011

Jérémy Tillier
Affiliation:
jeremy.tillier@grenoble.cnrs.fr, CNRS, Institut Néel/CRETA, Grenoble, France
Antinéa Einig
Affiliation:
antinea.einig@fr.schneider-electric.com, Schneider Electric, Grenoble, France
Daniel Bourgault
Affiliation:
daniel.bourgault@grenoble.cnrs.fr, CNRS, Institut Néel/CRETA, Grenoble, France
Philippe Odier
Affiliation:
philippe.odier@grenoble.cnrs.fr, CNRS, Institut Néel/CRETA, Grenoble, France
Luc Ortega
Affiliation:
luc.ortega@grenoble.cnrs.fr, CNRS, Institut Néel, Grenoble, France
Sébastien Pairis
Affiliation:
sebastien.pairis@grenoble.cnrs.fr, CNRS, Institut Néel, Grenoble, France
Laureline Porcar
Affiliation:
laureline.porcar@grenoble.cnrs.fr, CNRS, Institut Néel/CRETA, Grenoble, France
Paul Chometon
Affiliation:
paul.chometon@grenoble.cnrs.fr, CNRS, CRETA, Grenoble, France
Nathalie Caillault
Affiliation:
nathalie.caillault@schneider-electric.com, Schneider Electric, Grenoble, France
Laurent Carbone
Affiliation:
laurent.carbone@schneider-electric.com, Schneider Electric, Grenoble, France
Get access

Abstract

Ni-Mn-Ga films in the austenite and the martensite structures at room temperature have been obtained using the DC magnetron sputtering technique. Two elaboration processes were studied. A first batch of samples was deposited using a resist sacrificial layer in order to release the film from the substrate before vacuum annealing. This process leads to polycrystalline films with a strong (022) fiber texture. The martensitic phase transformation of such polycrystalline freestanding films has been studied by optical and scanning electron microscopy. A second batch of samples was grown epitaxially on (100)MgO substrates using different deposition temperatures. The texture has been analyzed with four-circle X-ray diffraction. Epitaxial films crystallized both in the austenite and the martensite structures at room temperature have been studied.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Söderberg, O., Aaltio, I., Ge, Y., Heczko, O. and Hannula, S.-P., Mater. Sci. Eng. A 481-482, 80 (2008)Google Scholar
2 Chernenko, V.A. and Besseghini, S., Sens. Actuators A 142, 542 (2008)Google Scholar
3 Ullakko, K., Huang, J.K., Kantner, C., O'Handley, R.C. and Kokorin, V.V., Appl. Phys. Lett. 69, 1966 (1996)Google Scholar
4 James, R.D., Tickle, R. and Wuttig, M., Mater. Sci. Eng. A 273-275, 320 (1999)Google Scholar
5 Sozinov, A., Likhachev, A.A., Lanska, N. and Ullakko, K., Appl. Phys. Lett. 80, 1746 (2002)Google Scholar
6 Müllner, P., Chernenko, V.A. and Korstorz, G., J. Appl. Phys. 95, 1531 (2004)Google Scholar
7 Xu, H.B., Li, Y. and Jiang, C.B., Mater. Sci. Eng. A 438-440, 1065 (2006)Google Scholar
8 Dong, J.W., Xie, J.Q., Lu, J., Adelmann, C., Palmstrom, C.J., Cui, J., Pan, Q., Shield, T.W., James, R.D. and McKernan, S., J. Appl. Phys. 95, 2593 (2004)Google Scholar
9 Chernenko, V.A., Besseghini, S., Hagler, M., Müllner, P., Ohtsuka, M. and Stortiero, F., Mater. Sci. Eng. A 481-482, 271 (2008)Google Scholar
10 Buschbeck, J., Niemann, R., Heczko, O., Thomas, M., Schultz, L. and Fähler, S., Acta Mater. 57, 2516 (2009)Google Scholar
11 Heczko, O., Thomas, M., Buschbeck, J., Schultz, L. and Fähler, S., Appl. Phys. Lett. 92, 072502 (2008)Google Scholar
12 Hakola, A., Heczko, O., Jaakkola, A., Kajava, T. and Ullakko, K., Appl. Surf. Sci. 238, 155 (2004)Google Scholar
13 Thomas, M., Heczko, O., Buschbeck, J., Rössler, U.K., McCord, J., Scheerbaum, N., Schultz, L. and Fähler, S., New. J. Phys. 10, 023040 (2008)Google Scholar
14 Tillier, J., Bourgault, D., Barbara, B., Pairis, S., Porcar, L., Chometon, P., Dufeu, D., Caillault, N. and Carbone, L., J. Alloys Compd. 489, 509 (2010)Google Scholar
15 Villaume, A., Antonevici, A., Bourgault, D., Leggeri, J.P., Porcar, L. and Villard, C., Rev. Sci. Instrum. 79, 023904 (2008)Google Scholar
16 Sozinov, A., Likhachev, A.A., Lanska, N., Söderberg, O., Koho, K., Ullakko, K., Lindroos, V.K., J. Phys. IV 115, 121 (2004)Google Scholar