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In-situ Observation of Cu Filaments Evolution in SiO2 layer

Published online by Cambridge University Press:  04 August 2017

Zhi Zhang ,
Fang Yuan ,
Chunru Liu ,
Feichi Zhou ,
Hei Man Yau ,
Wei Lu ,
X.Y. Qiu ,
H. -S. Philip Wong ,
Yang Chai  and
Jiyan Dai
Zhi Zhang
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China
Fang Yuan
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China Department of Electrical Engineering and Stanford SystemX Alliance, Stanford University, Stanford, CA, USA
Chunru Liu
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China
Feichi Zhou
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China
Hei Man Yau
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China
Wei Lu
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China
X.Y. Qiu
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China
H. -S. Philip Wong
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China Department of Electrical Engineering and Stanford SystemX Alliance, Stanford University, Stanford, CA, USA
Yang Chai
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China
Jiyan Dai
Affiliation:
Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, P. R. China

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1622 - 1623
Copyright
© Microscopy Society of America 2017 

References

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