Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-26T08:52:12.236Z Has data issue: false hasContentIssue false

Advanced Ti-Implanted Optical Waveguides in LiNbO3

Published online by Cambridge University Press:  25 February 2011

Ch. Buchal
Affiliation:
Solid State Div., Oak Ridge Natl. Lab., Oak Ridge TN 37831 also: IFF, KFA, D-5170 Jülich, W. Germany
P. R. Ashley
Affiliation:
US Army Missile, Lab., Redstone Arsenal, AL 35898
D. K. Thomas
Affiliation:
Solid State Div., Oak Ridge Natl. Lab., Oak Ridge TN 37831
B. R. Appleton
Affiliation:
Solid State Div., Oak Ridge Natl. Lab., Oak Ridge TN 37831
Get access

Abstract

LiNbO3 is the best substrate for modulators and switches for integrated optics. Efficient low loss waveguides for light in LiNbO3 are formed by introducing Ti-ions into its lattice, thus increasing locally the ordinary and the extraordinary indices of refraction. We are the first to use the very versatile technique of ion-implantation to administer Ti into LiNbO3. This implantation process offers the possibility to introduce significantly more Ti into a well-defined volume than conventional diffusion techniques. During this process first an amorphous non-equilibrium phase is generated, which has to be kept at low temperatures in order to prevent segregation. Subsequent thermal treatment leads to solid phase epitaxy and restores the desired stable crystalline state. We have used this technique to fabricate excellent planar waveguides, channel waveguides and Mach-Zehnder modulators.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Holman, R. L. and Smyth, D. M., Processing of Guided Wave Optoelectronic Materials, Proceedings of the Society of Photo-Optical Instrumentation Engineers, Vol.460, SPIE, Bellingham, Washington, 1984).Google Scholar
2. Hunsperger, R. B., Integrated Opics: Theory and Technology (Springer, Berlin-New York, 1985).Google Scholar
3. Schmidt, R. V. and Kaminow, I. P., Appl. Phys. Lett. 25 458 (1974).CrossRefGoogle Scholar
4. Fukuma, M., Noda, J. and Iwasaki, H., J. Appl. Phys. 49 3693 (1978); J. Noda, J. Opt. Commun. 164 (1980).CrossRefGoogle Scholar
5. Burns, W. K., Klein, P. H., West, E. J. and Plew, L. E., J. Appl. Phys. 5 6175 (1979).CrossRefGoogle Scholar
6. Ashley, P. R. and Chang, W. S. C., Appl. Phys. Lett. 4, 840 (1984).CrossRefGoogle Scholar
7. Minakata, M., Saito, S., Shibata, M., and Miyazawa, S., J. Appl. Phys. 49, 4677 (1978); M. Minakata, S. Saito and M. Shibata, J. Appl. Phys. 50, 3063 (1979).CrossRefGoogle Scholar
8. Neyer, A, in Integrated Op. edited by Nolting, H. P. and Ulrich, R. (Springer, Berlin 1986) p. 67.Google Scholar
9. Vollmer, J., Nisius, J. P., Hertel, P. and Kraitzig, E., Appl. Phys. A32, 125 (1983).CrossRefGoogle Scholar
10. Appleton, B. R., Beardsley, G. M., Farlow, G. C., Christie, W. H., and Ashley, P. R., J. Mat. Res., 1, 104 (1986), and ref. therein.CrossRefGoogle Scholar
11. Townsend, P. D., Proceedings of the International Society of Optical Engineering, Vol.401, p. 295, Bellingham, Wash., 1983.P. J. Chandler, E. Glavas, F. Lama, S. E. Lax and P. D. Townsend, Rad. Effects, to be published (1986). P. D. Townsend, Vacuum, 3, 395 (1984).Google Scholar
12. Naden, J. M. and Weiss, B. L., J. Lightwave Techn. LT-3, 855 (1985).CrossRefGoogle Scholar
13. Reed, G. T. and Weiss, B. L., Nucl. Instr. Meth. Phys. Res., to be published (1986).Google Scholar
14. Buchal, Ch., Appleton, B. R., Christie, W. H. and Ashly, P. R., in Defect Properties and Processing of High Technology Nonmetallic Materials Materials, edited by Chen, Y., Kingery, W. D., Stokes, R. J. (Materials Research Society, Pittsburgh, PA, (1986).Google Scholar
15. Buchal, Ch., Ashley, P. R. and Appleton, B. R., submitted to J. Mat. Res. (1987).Google Scholar
16. Nisius, J. P., Hertel, P., Kritzig, E. and Pape, H. in Ref. 8, p. 62 (1986).CrossRefGoogle Scholar