Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-26T09:29:52.500Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative Confocal and Environmental Scanning Electron Microscopy for Investigating the Fungal Invasion of Plant Surfaces in Their Native State

Published online by Cambridge University Press:  04 August 2017

Andrew J. Bowling ,
Heather E. Pence ,
Thomas Slanec  and
Leah L. Granke
Andrew J. Bowling
Affiliation:
Dow AgroSciences, Indianapolis, IN, 46268
Heather E. Pence
Affiliation:
Dow AgroSciences, Indianapolis, IN, 46268
Thomas Slanec
Affiliation:
Dow AgroSciences, Indianapolis, IN, 46268
Leah L. Granke
Affiliation:
Dow AgroSciences, Indianapolis, IN, 46268

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1336 - 1337
Copyright
© Microscopy Society of America 2017 

References

[1] Fones, H & Gurr, S Fungal Gen. and Biol. 79 2015). p. 3.CrossRefGoogle Scholar
[2] Troughton, JH & Hall, DM Aust. J. Biol. Sci. 20 1967). p. 509.Google Scholar