An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes

HS von Harrach; P Dona; B Freitag; H Soltau; A Niculae; M Rohde

doi:10.1017/S1431927609094288

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes

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