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Understanding B-Site Disorder in HAADF-STEM Images of Double Perovskite Thin Films Using the Quantum Excitation of Phonons Model

Published online by Cambridge University Press:  27 August 2014

Bryan D. Esser ,
Adrian J. D’Alfonso ,
Manisha Dixit ,
Robert E. A. Williams ,
Hamish L. Fraser ,
Leslie J. Allen  and
David W. McComb
Bryan D. Esser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Adrian J. D’Alfonso
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
Manisha Dixit
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Robert E. A. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Hamish L. Fraser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Leslie J. Allen
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
David W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 184 - 185
Copyright
Copyright © Microscopy Society of America 2014 

References

.Google Scholar
[1] Findlay, SD, Klenov, DO, Stemmer, S, Allen, LJ, Sci., Mat. and Tech. 24 (2008) p.660.Google Scholar
[2] LeBeau, JM and Stemmer, S Ultramicroscopy 108 (2008) p.1653.Google Scholar
[3] Hauser, AJ, et al, Phys. Rev. B 85 (2012) p.161201(R).Google Scholar
[4] Kobayashi, KL, et al, Nature 395 (1998) p.677.Google Scholar
[5] Serrate, JM, Teresa, De, Ibarra, MR J. Phys: Condens. Matter 19 (2007) p.023201.Google Scholar
[6] Forbes, BD, etal, Phys. Rev. B. 82 (2010) p. 104103.Google Scholar