Hostname: page-component-848d4c4894-p2v8j Total loading time: 0 Render date: 2024-05-03T01:34:14.857Z Has data issue: false hasContentIssue false

First Data from a Commercial Local Electrode Atom Probe (LEAP)

Published online by Cambridge University Press:  01 June 2004

Thomas F. Kelly
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Tye T. Gribb
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Jesse D. Olson
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Richard L. Martens
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Jeffrey D. Shepard
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Scott A. Wiener
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Thomas C. Kunicki
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Robert M. Ulfig
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Daniel R. Lenz
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Eric M. Strennen
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Edward Oltman
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Joseph H. Bunton
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
David R. Strait
Affiliation:
Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA
Get access

Abstract

The first dedicated local electrode atom probes (LEAP [a trademark of Imago Scientific Instruments Corporation]) have been built and tested as commercial prototypes. Several key performance parameters have been markedly improved relative to conventional three-dimensional atom probe (3DAP) designs. The Imago LEAP can operate at a sustained data collection rate of 1 million atoms/minute. This is some 600 times faster than the next fastest atom probe and large images can be collected in less than 1 h that otherwise would take many days. The field of view of the Imago LEAP is about 40 times larger than conventional 3DAPs. This makes it possible to analyze regions that are about 100 nm diameter by 100 nm deep containing on the order of 50 to 100 million atoms with this instrument. Several example applications that illustrate the advantages of the LEAP for materials analysis are presented.

Type
Research Article
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Bajikar, S.S., Larson, D.J., Camus, P.P., & Kelly, T.F. (1996). Mass resolution enhancement in local-electrode atom probes: A study using field emitter arrays. J de Physique IV C5–6, 303308.Google Scholar
Cerezo, A., Godfrey, T.J., Huang, M., & Smith, G.D.W. (2000). Design of a scanning atom probe with improved mass resolution. Rev Sci Instrum 71, 30163023.Google Scholar
Cerezo, A., Godfrey, T.J., Sijbrandij, S.J., Smith, G.D.W., & Warren, P.J. (1998). Performance of an energy-compensated three-dimensional atom probe. Rev Sci Instrum 69, 4958.Google Scholar
Cerezo, A., Godfrey, T.J., & Smith, G.D.W. (1988a). Development and initial applications of a position-sensitive atom probe. J Phys 49-C6, 2530.Google Scholar
Cerezo, A., Godfrey, T.J., & Smith, G.D.W. (1988b). Application of a position-sensitive detector to atom probe microanalysis. Rev Sci Instrum 59, 862866.Google Scholar
Deconihout, B., Saint-Martin, R., Jarnot, C., & Bostel, A. (2003). Improvement of the mass resolution of the atom probe using a dual counter-electrode. Ultramicroscopy 95, 239249.Google Scholar
Kellogg, G.L. & Tsong, T.T. (1980). Pulsed-laser atom-probe field-ion microscopy. J Appl Phys 51, 11841193.Google Scholar
Kelly, T.F., Andrén, H.-O., Blavette, D., Camus, P.P., Cerezo, A., Menand, A., Miller, M.K., & Smith, G.D.W. (1994). Summary of discussion a the first workshop on three-dimensional atom-probe analysis—Its present and future. Appl Surf Sci 76/77, xxixxvi.Google Scholar
Kelly, T.F., Camus, P.P., Larson, D.J., Holzman, L.M., & Bajikar, S.S. (1995). High Mass Resolution Local-Electrode Atom Probe, United States Patent #5,440,124.
Kelly, T.F., Camus, P.P., Larson, D.J., Holzman, L.M., & Bajikar, S.S. (1996). On the many advantages of local electrode atom probes. Ultramicroscopy 62, 2942.Google Scholar
Kelly, T.F. & Larson, D.J. (2000). Local electrode atom probes. Mater Charact 44, 5985.Google Scholar
Larson, D.J., Cerezo, A., Clifton, P.H., Petford-Long, A.K., Martens, R.L., Kelly, T.F., & Tabat, N. (2001b). Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films. J Appl Phys 89, 75177521.Google Scholar
Larson, D.J., Clifton, P.H., Tabat, N., Cerezo, A., Petford-Long, A.K., Martens, R.L., & Kelly, T.F. (2000). Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces. Appl Phys Lett 77, 726728.Google Scholar
Larson, D.J., Wissman, B.D., Martens, R.L., Viellieux, R.J., Kelly, T.F., Gribb, T.T., Erskine, H.F., & Tabat, N. (2001a). Advances in atom probe specimen fabrication from planar multilayer thin film structures. Microsc Microanal 7, 2431.Google Scholar
Marteau, L., Pareige, C., & Blavette, D. (2001). Imaging the three orientation variants of the DO22 phase by 3D atom probe microscopy. J Microsc 204, 247251.Google Scholar
Miller, M.K. (1997). Three-dimensional atom probes. J Microsc 186, 116.Google Scholar
Miller, M.K. & Babu, S.S. (2000). Phase compositions in alloy 718: A comparison between APT/APFIM measurements and thermodynamic predictions. Advanced Technologies for Superalloy Affordability, Proc. 129th TMS annual meeting, TMS2000, Chang, K.M., Srivastava, S.K., Furrer D.U. & Bain, K.R. (Eds.), p. 63. Warrendale, PA: TMS.
Müller, E.W., Panitz, J.A., & McClean, S.B. (1968). The atom probe field ion microscope. Rev Sci Instrum 39, 8386.Google Scholar
Nishikawa, O. & Kimoto, M. (1994). Toward a scanning atom probe-computer simulation of electric field. Appl Surf Sci 76/77, 424430.Google Scholar
Nishikawa, O., Kimoto, M., & Ishikawa, Y. (1995). Development of a scanning atom probe. J Vac Sci Technol B 13, 599602.Google Scholar
Panitz, J.A. (1973). The 10 cm atom probe. Rev Sci Instrum 44, 10341038.Google Scholar
Panitz, J.A. (1978). Imaging atom-probe mass spectroscopy. Prog Surf Sci 8, 219262.Google Scholar
Poschenrieder, W.P. (1971). Multiple-focusing time of flight mass spectrometers. I. TOFMS with equal momentum acceleration. Int J Mass Spectrom Ion Phys 6, 413426.Google Scholar
Vurpillot, F., Da Costa, G., Menand, A., & Blavette, D. (2001). Structural analyses in three-dimensional atom probe: A Fourier transform approach. J Microsc 203, 295302.Google Scholar
Vurpillot, F., Renaud, L., & Blavette, D. (2003). A new step towards the lattice reconstruction in 3DAP. Ultramicroscopy 95, 223229.Google Scholar
Warren, P., Cerezo, A., & Smith, G.D.W. (1998). Observation of atomic planes in 3DAP analysis. Ultramicroscopy 73, 261266.Google Scholar