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Exafs Studies of Multilayer Interfaces

Published online by Cambridge University Press:  21 February 2011

S. M. Heald  and
G. M. Lamble
S. M. Heald
Affiliation:
Brookhaven Laboratory, Upton, NY 11973, USA
G. M. Lamble
Affiliation:
Brookhaven Laboratory, Upton, NY 11973, USA
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Abstract

Important for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni- Ti multilayers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988 , 133
Copyright
Copyright © Materials Research Society 1989

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References

[1] Stern, E. A. and Heald, S. M., in Handbook of Synchrotron Radiation, edited by Koch, E. E. (North-Holland,Amsterdam,1983) p. 955.Google Scholar
[2] Heald, S. M.,Tranquada, J. M., Clemens, B. M., and Stec, J. P., J. de Physique 47,C8–1061 (1986).Google Scholar
[3] Claeson, T., Boyce, J. B., Lowe, W. P., and Geballe, T. H., Phys. Rev. B29, 4969 (1984).CrossRefGoogle Scholar
[4] Lamble, G. M., Heald, S. M. in Multilayers, Synthesis, Properties, and Non-electronic Applications, edited by Barbee, T. W., Spaepen, F., and Greer, L. (Mat. Res. Soc. Proc. 103, Pittsburgh, PA 1988) pp. 101–07.Google Scholar
[5] Heald, S. M. and Tranquada, J. M., J. Appl. Phys., in press.Google Scholar
[6] Saxena, A. M. and Majkrzak, C. F., Proc. AIP Conf., 89, 193 (1982).CrossRefGoogle Scholar