Hostname: page-component-76fb5796d-wq484 Total loading time: 0 Render date: 2024-04-26T12:35:14.058Z Has data issue: false hasContentIssue false

Microstructure and magnetic properties of FePt:C nanocomposite films with low ordering temperature

Published online by Cambridge University Press:  24 June 2006

H. Wang*
Affiliation:
Faculty of Physics and Electronic Technology and Nanotechnology Research Centre, Hubei University, Wuhan 430062, China
F. J. Yang
Affiliation:
Faculty of Physics and Electronic Technology and Nanotechnology Research Centre, Hubei University, Wuhan 430062, China
H. B. Wang
Affiliation:
Faculty of Physics and Electronic Technology and Nanotechnology Research Centre, Hubei University, Wuhan 430062, China
S. X. Xue
Affiliation:
Faculty of Physics and Electronic Technology and Nanotechnology Research Centre, Hubei University, Wuhan 430062, China
Y. Gao
Affiliation:
Faculty of Physics and Electronic Technology and Nanotechnology Research Centre, Hubei University, Wuhan 430062, China
Z. B. Huang
Affiliation:
Faculty of Physics and Electronic Technology and Nanotechnology Research Centre, Hubei University, Wuhan 430062, China
C. P. Yang
Affiliation:
Faculty of Physics and Electronic Technology and Nanotechnology Research Centre, Hubei University, Wuhan 430062, China
M. F. Chiah
Affiliation:
Department of Electronic Engineering, The Chinese University of Hong Kong, Hong Kong
N. Ke
Affiliation:
Department of Electronic Engineering, The Chinese University of Hong Kong, Hong Kong
W. Y. Cheung
Affiliation:
Department of Electronic Engineering, The Chinese University of Hong Kong, Hong Kong
S. P. Wong
Affiliation:
Department of Electronic Engineering, The Chinese University of Hong Kong, Hong Kong
Q. Li
Affiliation:
Department of Physics, The Chinese University of Hong Kong, Hong Kong
Get access

Abstract

FePt:C films were prepared by filtered vacuum arc deposition. A strong dependence of coercivity and ordering of the face-central tetragonal structure on both C concentration and annealing temperature was observed. With C concentration of 21%, the sample with a coercivity of 5.7 kOe was obtained when annealing temperature was only 350 °C. Transmission electron microscope observations revealed that FePt grains with an average size of 4.1 nm were embedded in C and appeared to be well isolated.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Sun, S.H., Murray, C.B., Weller, D., Folks, L., Moser, A., Science 287, 1989 (2000) CrossRef
Yu, M., Liu, Y., Moser, A., Weller, D., Sellmyer, D.J., Appl. Phys. Lett. 75, 3992 (1999) CrossRef
Zeng, H., Sun, S.H., Vedantam, T.S., Liu, J.P., Dai, Z.R., Appl. Phys. Lett. 80, 2583 (1999) CrossRef
Sui, Y.C., Zhou, J., Li, X.Z., Skomski, R., Sellmyer, D.J., J. Appl. Phys. 95, 6741 (2004) CrossRef
Stoyanov, S., Huang, Y., Zhang, Y., Skumryev, V., Hadjipanayis, G.C., J. Appl. Phys. 3, 7190 (2003) CrossRef
Huang, Y.H., Zhang, Y., Hadjipanayis, G.C., Weller, D., J. Appl. Phys. 93, 7172 (2003) CrossRef
Ko, H.S., Perumal, A., Shin, S.C., Appl. Phys. Lett. 82, 2311 (2003) CrossRef
Perumal, A., Ko, H.S., Shin, S.C., Appl. Phys. Lett. 83, 3326 (2003) CrossRef
Yan, M.L., Li, X.Z., Gao, L., Liou, S.H., Sellmyer, D.J., Appl. Phys. Lett. 83, 3332 (2003) CrossRef
H.S. Nalwa, Magnetic nanostructures (American scientific publishers, 2002), p. 407
Anders, S., Toney, M.F., Sun, S.S., Murray, C.B., J. Appl. Phys. 93, 6299 (2003) CrossRef
Platt, C.L., Wierman, K.W., Svedberg, E.B., Veerdonk, R.V., Howard, J.K., J. Appl. Phys. 92, 6104 (2002) CrossRef
Sun, X.C., Kang, S.S., Harrell, J.W., Nikles, D.E., J. Appl. Phys. 93, 7337 (2003) CrossRef
Toney, M.F., Lee, W.Y., Hedstrom, J.A., Kellock, A., J. Appl. Phys. 93, 9902 (2003) CrossRef
Zhang, Y., Wan, J., Bonder, M.J., Hadjipanayis, G.C., Weller, D., J. Appl. Phys. 93, 7175 (2003) CrossRef
Yogi, T., Nguyen, T.A., IEEE T. Magn. 29, 307 (1993) CrossRef