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Modeling of Interface Scattering Effects during Light Emission from Thin Film Phosphors for Field Emission Displays

Published online by Cambridge University Press:  14 March 2011

K. G. Cho ,
R. K. Singh ,
Z. Chen ,
D. Kumar  and
P. H. Holloway
K. G. Cho
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
R. K. Singh
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
Z. Chen
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
D. Kumar
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
P. H. Holloway
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
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Abstract

It has been experimentally shown that the light trapping due to internal reflection from a smooth surface is reduced as the surface becomes progressively rougher. Although this phenomenon is qualitatively understood well, there has been a lack of detailed analysis of the scattering phenomenon which affects the light emission from thin film phosphors (TFPs). Factors which affect the light emission from the TFPs include electron beam-solid interaction (EBSI), film thickness, microstructure, surface recombination rate, surface roughness, and substrate (thus the interface formed). In many cases, they cannot be varied independently and thus making it difficult to interpret the results quantitatively. Furthermore, as the surface roughness is smaller or same as the wavelength of the emitted light, classical theories based on rectilinear propagation of the light cannot be used without gross simplification. A new theoretical model has been developed by incorporating diffraction scattering at the various interfaces and the factors mentioned above. The model provides an integrated solution to explain the cathodoluminescence (CL) properties of TFPs for field emission displays (FEDs).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 621: Symposia Q/R – Electron-Emissive Materials, Vacuum Microelectronics… , 2000 , Q2.6.1
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

1. Jones, S. L., Kumar, D., Cho, K. G., Singh, R. K., and Holloway, P. H., Displays 19, 151 (1999).Google Scholar
2. Lee, Song Jae, Jpn. J. Appl. Phys. 37, 509 (1998).Google Scholar
3. Cho, K. G., Kumar, D., Jones, S. L., Lee, D. G., Holloway, P. H., and Singh, R. K., J. Electrochem. Soc. 145, 3456 (1998).Google Scholar
4. Bennett, H. E. and Porteus, J. O., J. Opt. Soc. Amer. 51 (2), 123 (1961).Google Scholar
5. Toporets, A. S., Sov. J. Opt. Technol. 46 (1), 35 (1979).Google Scholar
6. Cho, K. G., Ph.D. Dissertation, University of Florida, 2000.Google Scholar
7. Roos, A., and Ronnow, D., Applied Optics 33 (34), 7908 (1994).Google Scholar
8. Yoo, J. S. and Lee, J. D., J. Appl. Phys. 81 (6), 2810 (1997).Google Scholar
9. Yacobi, B. G. and Holt, D. B., Cathodoluminescence microscopy of inorganic solids. Plenum, New York, 1 (1990).Google Scholar