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Use of the Gabor Filter for Edge Detection in the Analysis of Zinc Oxide Nanowire Images

Published online by Cambridge University Press:  27 August 2014

B. E. Scanley ,
T. E. Sadowski ,
C. I. Pelligra ,
M. E. Kreider ,
C.O. Osuji  and
C. C. Broadbridge
B. E. Scanley
Affiliation:
Department of Physics, Southern Connecticut State University, New Haven, U.S.A.
T. E. Sadowski
Affiliation:
Department of Physics, Southern Connecticut State University, New Haven, U.S.A.
C. I. Pelligra
Affiliation:
School of Engineering and Applied Science, Yale University, New Haven, U.S.A.
M. E. Kreider
Affiliation:
CRISP Research Experiences for Undergraduates (REU) Program at Yale/SCSU, New Haven, U.S.A.
C.O. Osuji
Affiliation:
School of Engineering and Applied Science, Yale University, New Haven, U.S.A. Center for Research on Interface Structures and Phenomena at Yale/SCSU, New Haven, U.S.A.
C. C. Broadbridge
Affiliation:
Department of Physics, Southern Connecticut State University, New Haven, U.S.A. Center for Research on Interface Structures and Phenomena at Yale/SCSU, New Haven, U.S.A.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 830 - 831
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Gabor, D. J., Instn., J., Elect, Engrs 93 (1946), p. 429.Google Scholar
[2] Mehrotra, R., Namuduri, K. R., and Ranganathan, N. Pattern Recognition 25 (1992), p. 1479.Google Scholar
[3] Zhang, S., Pelligra, C. I., Keskar, G., Jiang, J., Majewski, P. W., Taylor, A. D., Ismail-Beigi, S., Pfefferle, L. D., and Osuji, C. O. Adv. Materials 24 (2012), p. 82.Google Scholar
[4] The authors acknowledge primary financial support from CRISP and the CRISP Research Experiences for Undergraduates (REU) program (NSF MRSEC DMR 1119826). Partial support by the DOE (DE-SC0005072).Google Scholar