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Electrical Properties of Natural Iia Diamonds Using Photo- and Particle Excitation

Published online by Cambridge University Press:  21 February 2011

L. S. Pan ,
S. Han ,
D. R. Kania ,
K. K. Gan ,
S. Zhao ,
H. Kagan ,
R. Kassa ,
R. Malchow ,
F. Morrow  and
W. F. Palmer
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L. S. Pan
Affiliation:
L-476, Lawrence Livermore National Laboratory, Livermore, CA 94550
S. Han
Affiliation:
L-476, Lawrence Livermore National Laboratory, Livermore, CA 94550
D. R. Kania
Affiliation:
L-476, Lawrence Livermore National Laboratory, Livermore, CA 94550
K. K. Gan
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
S. Zhao
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
H. Kagan
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
R. Kassa
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
R. Malchow
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
F. Morrow
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
W. F. Palmer
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
C. White
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH 43210
S. K. Kim
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854
F. Sannes
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854
S. Schnetzer
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854
R. Stone
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854
G. B. Thomson
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854
Y. Sugimoto
Affiliation:
KEK Laboratory, Tsukuba-shi, Ibaraki-ken, Japan 305
A. Fry
Affiliation:
Physics Division, SSC Laboratory, Dallas, TX 75237
S. Olsen
Affiliation:
Department of Physics, University of Rochester, Rochester, NY 14627
M. Franklin
Affiliation:
Department of Physics, Harvard University, Boston, MA 02138
J. W. Ager III
Affiliation:
Center for Advanced Materials, Lawrence Berkeley Laboratory, Berkeley, CA 94720
P. Pianetta
Affiliation:
Stanford Synchrotron Radiation Laboratory, SLAC, Stanford, CA 94309
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Abstract

Two complementary techniques are used to study the electrical transport properties related to the use of diamonds as materials for ionizing radiation detectors. Transient photoconductivity using soft x-rays is used to probe the first few microns of the material, while ionizing particle-excited conductivity is used to probe the entire bulk of the material (1 millimeter). Both techniques measure the mean drift distance of free carriers, or the collection distance d. In addition, transient photoconductivity is able to extract the lifetimes and mobilities of the excited carriers. The collection distance measured by the two methods are in agreement, suggesting the material is homogeneous. At an applied field of 10 kV/cm, d is 25 to 30 microns, and, up to a field of 25 kV/cm, d has not saturated. The lifetime varies between 100 and 600 ps, and the mobility varies between 1000 and 4000 cm2/V-s, the range due to natural variations from sample to sample. The primary defects limiting the lifetime are believed to be nitrogen impurities and dislocations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 245
Copyright
Copyright © Materials Research Society 1993

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References

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