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High Performance Silicon Drift Detectors

Published online by Cambridge University Press:  04 August 2017

A. Pahlke ,
T. Eggert ,
R. Fojt ,
M. Fraczek ,
L. Hollt ,
J. Knobloch ,
N. Miyakawa ,
J. Rumpff ,
O. Scheid  and
A. Simsek
...Show all authors
I. Wennemuth
Affiliation:
KETEK GmbH, Hofer Str. 3, 81737 Munich, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 72 - 73
Copyright
© Microscopy Society of America 2017 

References

[1] Huebner, S., Miyakawa, N., Kapser, S., Pahlke, A. & Kreupl, F., IEEE Trans. Nucl. Sci. 62(2), 588 (2015).CrossRefGoogle Scholar
[2] Huebner, S., Miyakawa, N., Pahlke, A. & Kreupl, F., Phys. Status Solidi B 252(11), 2564 (2015).CrossRefGoogle Scholar