4 results
Opportunities and Challenges of Ultra Short Pulsed Lasers with Dual Focused Ion Beams for Characterization of Full-Scale Electronic Devices
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 884-886
- Print publication:
- August 2022
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Observations of Damage, Defects, and Structuring in Femtosecond Laser Ablated Surfaces
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 872-873
- Print publication:
- August 2022
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Acquisition, Reconstruction and Curation of Multimodal 3D TriBeam Data
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 354-355
- Print publication:
- August 2019
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Processing-Microstructure Relationships From 3D Characterization of Additively Manufactured Metals
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2582-2583
- Print publication:
- August 2019
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