2 results
In-situ Characterization of MoS2 Based Field Effect Transistors during Ion Irradiation
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 294-296
- Print publication:
- August 2020
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Direct Correction of Residual Symmetric Aberrations in Electron Holograms of Weak Phase Objects
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 98-99
- Print publication:
- August 2019
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