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Turn-Key Compressed Sensing System for Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2516-2518
- Print publication:
- August 2022
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Characterization of Si in a W matrix Using Diffraction Contrast in the TEM
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 790-791
- Print publication:
- August 2002
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In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 390-391
- Print publication:
- August 2002
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