15 results
Morphological and Compositional Analysis of Organic LEDs with Silicon QDs as Active Layer (SiLEDs)
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1638-1639
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- August 2013
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Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 704-705
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- August 2013
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In-situ Straining Analysis by TEM Orientation Mapping (EBSD-like TEM) - Direct Imaging of Deformation Processes in Nanocrystalline Metals
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 724-725
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- July 2012
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Strain mapping of triple and quadruple junctions in deformed nanocrystalline Palladium
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1900-1901
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- July 2012
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Porosity and Wetting Behavior in Model Systems for Hydrogen Storage
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1666-1667
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- July 2010
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Characterization of Metastable ZrO2-Y2O3-Al2O3 Mixed Nanocrystals
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1656-1657
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- July 2010
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Polymer Penetration of Nanoporous Aluminum Anodic Layers – Analytical cryoTEM and Electron Tomography Analysis in Corrosion Protection,
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 990-991
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- July 2009
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Microstructure of Aragonite Platelets in Nacre
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 900-901
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- July 2009
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Towards a Quantitative Understanding in Electron Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 602-603
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- July 2009
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Electron Tomography for Analysis of Catalysts
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1074-1075
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- August 2008
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New Developments in Focal-Series Reconstruction
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1170-1171
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- August 2007
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Recent Developments in Electron Tomography, Possibilities and a Few Limitations
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 152-153
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- August 2007
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Electron Tomographic Characterization of ErSi2 and GexSi1-x Nanoparticles Prepared by Doping of 4H-SiC
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1546-1547
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- August 2006
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Application of Electron Tomography for Semiconductor Device Analysis
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1552-1553
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- August 2006
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TEM Analysis of Aluminum Anodization Layers – Cryo-EFTEM and Electron Tomography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1580-1581
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- August 2006
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