2 results
Viscoelastic Modeling and Reliability Assessment of Microelectronics Packages
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1158 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1158-F01-08
- Print publication:
- 2009
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- Article
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Process-Oriented Stress Modeling and Stress Evolution During Cu/Low-K BEOL Processing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 812 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, F1.8
- Print publication:
- 2004
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- Article
- Export citation