1 results
Identifying and Engineering the Stacking Sequence in CVD Grown Few-layer MoS2 via Aberration-corrected STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2006-2007
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation