20 results
3D Correlative Analytical STEM at the Atomic Scale
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 144-145
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- July 2010
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Performance of Corrected Transmission Electron Microscopes in Combination with an In-Column Filter and a Distortion-Free Monochromator
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 46-47
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- July 2010
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Advantages of Monochromated Low Voltage Aberration Corrected TEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 118-119
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- July 2010
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Caught between Ions and Electrons - the Best of Helium Ion Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 600-601
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- July 2010
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DNA Sequencing with TEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1768-1769
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- July 2010
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Aberration-Correction in a Monochromated and Energy Filtered Environment,
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1490-1491
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- July 2009
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Characterization of CVD Graphene Films on Ni Substrate by EBSD and Low-kV EDS
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 424-425
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- July 2009
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Pre-sharpened Microtips: An Efficient Sample Preparation Method for Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 296-297
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- July 2009
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One Year On: New and Unique Applications of He Ion Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 652-653
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- July 2009
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High Resolution Sculpting and Imaging for Graphene Nano-structures
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1166-1167
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- July 2009
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Correlative Microscopy: Progress in Simultaneous Atomic-column XEDS and EELS, using a Monochromated, Aberration-corrected STEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 472-473
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- July 2009
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Precision Material Modification and Patterning with Helium Ions
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 658-659
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- July 2009
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TEM Correlation between the Structural and Optical Properties Of Rotationally Twinned InP Nanowires
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 414-415
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- August 2008
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Fabrication and Application of Nanopores using TEM, STEM and Ion Beams
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 244-245
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- August 2008
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TEM Survey of the Cytoplasmic wound reaction of Caulerpa prolifera
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1444-1445
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- August 2008
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Application of the Helium Ion Microscope for the Imaging and Analysis of Nanomaterials
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1184-1185
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- August 2008
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Nanoscale Engineering and E-Beam Lithography Using (S)TEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 532-533
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- August 2007
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Imaging of Nanoscale Patterns on Bubbles in Foams
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 592-593
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- August 2007
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Advanced Methods of Nanowire and Nano-Device Analysis
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 770-771
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- August 2007
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Nanoscale Engineering with a TEM for DNA Sequencing
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 638-639
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- August 2006
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