3 results
Voltage, Fluence, and Polarity Dependence of Trap Generation Inside of Thin Silicon Oxide Films*
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- Journal:
- MRS Online Proceedings Library Archive / Volume 284 / 1992
- Published online by Cambridge University Press:
- 22 February 2011, 293
- Print publication:
- 1992
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Comparison of the Electrical Properties of Thermal and Ion Beam Oxides***
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- Journal:
- MRS Online Proceedings Library Archive / Volume 93 / 1987
- Published online by Cambridge University Press:
- 25 February 2011, 137
- Print publication:
- 1987
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Silicon Quality Versus Thickness For Novel Silicon On Boron Phosphide Soi Process
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- Journal:
- MRS Online Proceedings Library Archive / Volume 91 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 381
- Print publication:
- 1987
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