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Annealing effect in DC and RF sputtered ITO thin films
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- Journal:
- The European Physical Journal - Applied Physics / Volume 39 / Issue 1 / July 2007
- Published online by Cambridge University Press:
- 14 July 2007, pp. 1-5
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- July 2007
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Prism coupling as a non destructive tool for optical characterization of (Al,Ga) nitride compounds
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 747-753
- Print publication:
- 2000
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Prism Coupling as a Non Destructive Tool for Optical Characterization of (Al,Ga) Nitride Compounds
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W11.49
- Print publication:
- 1999
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