20 results
Deformation Mechanisms and Residual Stress Distributions in B4C-TiB2 Directionally Solidified Eutectics
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 216-217
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- July 2010
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The Effects of Nano-Crystal Distribution and Structure on the Transport in Vanadium Oxide Thin Films
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1654-1655
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- July 2010
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Micro-Twinned VOx Nanocrystalline Film and Hopping Conduction
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1274-1275
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- July 2010
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In-situ TEM Study of Thin-film Vanadium Oxide Stability
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1002-1003
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- July 2009
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Stoichiometry of Nanocrystalline VOx Thin Films Determined by Electron Energy Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1004-1005
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- July 2009
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Anodic Tantalum Pentoxide: Chemical and Structural Characterization of a Bi-Layer Oxide
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 328-329
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- August 2008
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Site-Specific Studies of Electrical Heterogeneities in Ni-BaTiO3 Multilayer Ceramic Capacitors Using FIB and AEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 992-993
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- August 2008
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Disordered Vanadium Oxide Thin Films for Use in Infrared Detection
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 236-237
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- August 2008
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EDX Analysis of Grain Boundary Segregation in 1 at% Nd Doped Polycrystalline YAG
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1420-1421
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- August 2008
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TEM Characterization of Nanometer-Scale Spinel /Rocksalt Phase Decomposition in Nickel Magnanite Thin Film
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 228-229
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- August 2008
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TEM Characterization of Microtwins in VOx thin films
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 226-227
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- August 2008
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Microstructural and Interface Analysis of Ceramic Eutectic Composites
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 142-143
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- August 2008
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Microstructural and Radial Distribution Function Analysis of Hydrogenated Silicon, Germanium, and Silicon-Germanium Alloy Thin Films
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 406-407
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- August 2008
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Size Effects in the Vapor-Liquid Solid (VLS) Growth of Semiconductor Nanowires
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 6-7
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- August 2008
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Fluctuation Electron Microscopy Investigation of Anodic Ta2O5 and Nb2O5 Dielectrics
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1002-1003
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- August 2007
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HRTEM and EELS Study of Ni-BaTiO3 Interfacial Reactions Kinetics
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 800-801
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- August 2007
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Diameter Dependence of Ge-doped Si Nanowires Fabricated via Vapor-Liquid-Solid Growth
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 784-785
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- August 2007
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TEM and EELS Analysis of Anodized Nb2O5: Stoichiometry and Field-Induced Crystallization
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1194-1195
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- August 2006
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TEM and EELS Study of Dislocation Loops in Reduced BaTiO3
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1088-1089
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- August 2006
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Focused Ion Beam (FIB) Preparation and Electron Microscopy Analysis of Individual Microbolometer Pixels
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1270-1271
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- August 2006
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