13 results
Laser Ablation: A New Approach to APT Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 50-51
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- August 2022
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Save your FIB from the hard work – Large-scale sample prep using a LaserFIB
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 18-19
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- August 2021
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LaserFIB – the New All-in-one Tool to Speed up Sample Preparation for APT
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1978-1979
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- August 2020
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Achieving Nanoscale EDS Analysis in Transmission Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 514-515
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- August 2020
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Increasing the Stability and Quality of High-resolution FIB-SEM Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 896-897
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- August 2020
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From Photons to Electrons - A Correlative Workflow for Analysis and Preparation of Embedded Samples Using the LaserFIB
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 380-381
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- August 2020
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The Challenges of High-Resolution Analytic FIB-SEM Tomography and Their Solution
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 812-813
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- August 2018
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Characterization of the CIGS Solar Cell System in the FIB-SEM Laboratory
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 848-849
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- August 2018
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Towards Automatic Lamella Thinning Using Live Thickness Measurements and Smart End-Point Detection
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 304-305
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- July 2017
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ZEISS Crossbeam - Advancing Capabilities in High Throughput 3D Analysis and Sample Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 8-9
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- July 2017
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Automatic FIB-SEM Preparation of Straight Pillars for Micro-Compression Testing
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 190-191
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- July 2016
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Optimization of 3D EBSD in a FIB-SEM System Using a Static Sample Setup
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2035-2036
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- August 2015
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Mastering the Multi-scale Challenge: A Modern Correlation Environment
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 15-16
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- August 2015
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