3 results
Residual Stress in Focused Charged Particle Beam-Deposited Materials
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 880-881
- Print publication:
- August 2019
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Focused Ion Beams of Xe+, Ar+, O+, and N+: Sputter Rate Trends, Chemical Interactions, and Emerging Applications
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 860-861
- Print publication:
- August 2019
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Determining Interplanar Distances from STEM-EDX Hyperspectral Maps
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 944-945
- Print publication:
- July 2016
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