7 results
The Influence of Thermal-Mechanical Effectson Resistance Changes During and After Electromigration Experiments
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 513
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- 1995
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Reliability Study of On-Chip Interconnects : Prediction of Electromigration Resistance on A Short Time Scale
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- Journal:
- MRS Online Proceedings Library Archive / Volume 337 / 1994
- Published online by Cambridge University Press:
- 25 February 2011, 663
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- 1994
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Non-Destructive Electrical Techniques as Means for Understanding the Basic Mechanisms of Electromigration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 337 / 1994
- Published online by Cambridge University Press:
- 25 February 2011, 515
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- 1994
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Ion-Assisted Pulsed Laser Deposition of Cubic Boron Nitride on Si (100) Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 285 / 1992
- Published online by Cambridge University Press:
- 01 January 1992, 507
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- 1992
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Pulsed Microwave Processing of High-TC Superconducting Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 269 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 187
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- 1992
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Temperature Programmed Desorption of Hydrogen and Deuterium from Cvd Diamond Samples
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- Journal:
- MRS Online Proceedings Library Archive / Volume 270 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 401
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- 1992
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Pulsed Excimer Laser Ablation Deposition of Boron Nitride on Si (100) Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 242 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 593
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- 1992
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