We present a novel combined atomic force microscope (AFM) and
confocal laser scanning microscope (CLSM). The sample is supported
from the side by a boom from a piezo tube scanner, allowing
top and bottom access to the sample. The sample is scanned above
an inverted microscope objective with a fixed optical path for
fluorescent CLSM imaging. An AFM positioned directly above the
sample simultaneously measures surface topography. The piezo
tube scanner is angled, placing its center of scan curvature
directly above the microscope objective. This geometry allows
flat scans up to 300 μm on a side. Because the sample is
scanned, the AFM and CLSM images are acquired in direct registration.