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High-Resolution LEEM/PEEM by Employing Mirror-Type Aberration Correctors - in Memory of Gertrude F. Rempfer
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 302-303
- Print publication:
- August 2013
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- Article
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The Long-Lasting Struggle to Achieve Atomic-Resolution Microscopy by Correcting the Aberrations of Electron Lenses
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 2006-2007
- Print publication:
- August 2013
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- Article
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- You have access
- Export citation