10 results
Conductance transient comparative analysis of ECR-PECVD deposited SiNx, SiO2/SiNx and SiOxNy dielectric films on silicon substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E3.12
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- 2003
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On the interface quality of MIS structures fabricated from Atomic Layer Deposition of HfO2, Ta2O5 and Nb2O5−Ta2O5−Nb2O5 dielectric thin films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E3.18
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- 2003
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Conductance-transient three-dimensional profiling of disordered induced gap states on metal-insulator-semiconductor structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 699 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, R4.4
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- 2001
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Radio-Frequency Impedance Analysis of Anodic Tantalum Pentoxide Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 699 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, R6.5
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- 2001
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Fabrication of Ta2O5 Thin Films by Anodic Oxidation of Tantalum Nitride and Tantalum Silicide: Growing Mechanisms, Electrical Characterization and ULSI M-I-M Capacitor Performances
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- Journal:
- MRS Online Proceedings Library Archive / Volume 567 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 371
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- 1999
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Atomistic Modeling of Point and Extended Defects in Crystalline Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 532 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 43
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- 1998
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Monte Carlo Atomistic Simulation of Polycrystalline Aluminum Deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 514 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 127
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- 1998
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A New Methodology For Designing Floating Ring Termination Technique In High Voltage Structure
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- Journal:
- MRS Online Proceedings Library Archive / Volume 483 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 393
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- 1997
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Conductance Transients Study of Slow Traps in Al/SiNx:H/Si and Al/SiNx:H/InP Metal-Insulator-Semiconductor Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 500 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 87
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- 1997
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On the Forward Conduction Mechanisms in SiC P-N Junctions
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- Journal:
- MRS Online Proceedings Library Archive / Volume 339 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 151
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- 1994
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