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Definition of a simple resolution criterion in an Apertureless Scanning Near-Field Optical Microscope (A-SNOM): contribution of the tip vibration and lock-in detection
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- Journal:
- The European Physical Journal - Applied Physics / Volume 26 / Issue 1 / April 2004
- Published online by Cambridge University Press:
- 22 March 2004, pp. 45-52
- Print publication:
- April 2004
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Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope*
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- Journal:
- The European Physical Journal - Applied Physics / Volume 6 / Issue 2 / May 1999
- Published online by Cambridge University Press:
- 15 May 1999, pp. 171-178
- Print publication:
- May 1999
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