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STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1842-1843
- Print publication:
- July 2012
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- Article
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Effect Of The Eshelby-Stroh Twist In Dislocations In GaN Imaged End-On
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1338-1339
- Print publication:
- July 2012
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- Article
- Export citation