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Cryo-FIB Workflow for Fabricating Thin Lamellae Using TESCAN S8000G
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1016-1017
- Print publication:
- August 2019
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TESCAN Cryo FIB-SEM as a Flexible Tool for Advanced Sample Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 566-567
- Print publication:
- August 2019
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Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 884-885
- Print publication:
- August 2018
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