4 results
Aberration-corrected High Resolution Transmission Electron Microscopy of [(SnSe)]m[MoSe2]n films
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1630-1631
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- July 2012
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In Situ Probe Approaches for Charge Reduction, Sample Manipulation, and Modified Total Release Lift-out
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 640-641
- Print publication:
- July 2011
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HRTEM Contrast Analysis for Structure Characterization of Graphene Films Grown by CVD
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1436-1437
- Print publication:
- July 2011
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Atomic and Electronic Structure of Graphene Based on HRTEM and Ab-Initio Calculations
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1822-1823
- Print publication:
- July 2010
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