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Contributor affiliations
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- By Frank Andrasik, Melissa R. Andrews, Ana Inés Ansaldo, Evangelos G. Antzoulatos, Lianhua Bai, Ellen Barrett, Linamara Battistella, Nicolas Bayle, Michael S. Beattie, Peter J. Beek, Serafin Beer, Heinrich Binder, Claire Bindschaedler, Sarah Blanton, Tasia Bobish, Michael L. Boninger, Joseph F. Bonner, Chadwick B. Boulay, Vanessa S. Boyce, Anna-Katharine Brem, Jacqueline C. Bresnahan, Floor E. Buma, Mary Bartlett Bunge, John H. Byrne, Jeffrey R. Capadona, Stefano F. Cappa, Diana D. Cardenas, Leeanne M. Carey, S. Thomas Carmichael, Glauco A. P. Caurin, Pablo Celnik, Kimberly M. Christian, Stephanie Clarke, Leonardo G. Cohen, Adriana B. Conforto, Rory A. Cooper, Rosemarie Cooper, Steven C. Cramer, Armin Curt, Mark D’Esposito, Matthew B. Dalva, Gavriel David, Brandon Delia, Wenbin Deng, Volker Dietz, Bruce H. Dobkin, Marco Domeniconi, Edith Durand, Tracey Vause Earland, Georg Ebersbach, Jonathan J. Evans, James W. Fawcett, Uri Feintuch, Toby A. Ferguson, Marie T. Filbin, Diasinou Fioravante, Itzhak Fischer, Agnes Floel, Herta Flor, Karim Fouad, Richard S. J. Frackowiak, Peter H. Gorman, Thomas W. Gould, Jean-Michel Gracies, Amparo Gutierrez, Kurt Haas, C.D. Hall, Hans-Peter Hartung, Zhigang He, Jordan Hecker, Susan J. Herdman, Seth Herman, Leigh R. Hochberg, Ahmet Höke, Fay B. Horak, Jared C. Horvath, Richard L. Huganir, Friedhelm C. Hummel, Beata Jarosiewicz, Frances E. Jensen, Michael Jöbges, Larry M. Jordan, Jon H. Kaas, Andres M. Kanner, Noomi Katz, Matthew S. Kayser, Annmarie Kelleher, Gerd Kempermann, Timothy E. Kennedy, Jürg Kesselring, Fary Khan, Rachel Kizony, Jeffery D. Kocsis, Boudewijn J. Kollen, Hubertus Köller, John W. Krakauer, Hermano I. Krebs, Gert Kwakkel, Bradley Lang, Catherine E. Lang, Helmar C. Lehmann, Angelo C. Lepore, Glenn S. Le Prell, Mindy F. Levin, Joel M. Levine, David A. Low, Marilyn MacKay-Lyons, Jeffrey D. Macklis, Margaret Mak, Francine Malouin, William C. Mann, Paul D. Marasco, Christopher J. Mathias, Laura McClure, Jan Mehrholz, Lorne M. Mendell, Robert H. Miller, Carol Milligan, Beth Mineo, Simon W. Moore, Jennifer Morgan, Charbel E-H. Moussa, Martin Munz, Randolph J. Nudo, Joseph J. Pancrazio, Theresa Pape, Alvaro Pascual-Leone, Kristin M. Pearson-Fuhrhop, P. Hunter Peckham, Tamara L. Pelleshi, Catherine Verrier Piersol, Thomas Platz, Marcus Pohl, Dejan B. Popović, Andrew M. Poulos, Maulik Purohit, Hui-Xin Qi, Debbie Rand, Mahendra S. Rao, Josef P. Rauschecker, Aimee Reiss, Carol L. Richards, Keith M. Robinson, Melvyn Roerdink, John C. Rosenbek, Serge Rossignol, Edward S. Ruthazer, Arash Sahraie, Krishnankutty Sathian, Marc H. Schieber, Brian J. Schmidt, Michael E. Selzer, Mijail D. Serruya, Himanshu Sharma, Michael Shifman, Jerry Silver, Thomas Sinkjær, George M. Smith, Young-Jin Son, Tim Spencer, John D. Steeves, Oswald Steward, Sheela Stuart, Austin J. Sumner, Chin Lik Tan, Robert W. Teasell, Gareth Thomas, Aiko K. Thompson, Richard F. Thompson, Wesley J. Thompson, Erika Timar, Ceri T. Trevethan, Christopher Trimby, Gary R. Turner, Mark H. Tuszynski, Erna A. van Niekerk, Ricardo Viana, Difei Wang, Anthony B. Ward, Nick S. Ward, Stephen G. Waxman, Patrice L. Weiss, Jörg Wissel, Steven L. Wolf, Jonathan R. Wolpaw, Sharon Wood-Dauphinee, Ross D. Zafonte, Binhai Zheng, Richard D. Zorowitz
- Edited by Michael Selzer, Stephanie Clarke, Leonardo Cohen, Gert Kwakkel, Robert Miller, Case Western Reserve University, Ohio
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- Book:
- Textbook of Neural Repair and Rehabilitation
- Published online:
- 05 May 2014
- Print publication:
- 24 April 2014, pp ix-xvi
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Contributor affiliations
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- By Frank Andrasik, Melissa R. Andrews, Ana Inés Ansaldo, Evangelos G. Antzoulatos, Lianhua Bai, Ellen Barrett, Linamara Battistella, Nicolas Bayle, Michael S. Beattie, Peter J. Beek, Serafin Beer, Heinrich Binder, Claire Bindschaedler, Sarah Blanton, Tasia Bobish, Michael L. Boninger, Joseph F. Bonner, Chadwick B. Boulay, Vanessa S. Boyce, Anna-Katharine Brem, Jacqueline C. Bresnahan, Floor E. Buma, Mary Bartlett Bunge, John H. Byrne, Jeffrey R. Capadona, Stefano F. Cappa, Diana D. Cardenas, Leeanne M. Carey, S. Thomas Carmichael, Glauco A. P. Caurin, Pablo Celnik, Kimberly M. Christian, Stephanie Clarke, Leonardo G. Cohen, Adriana B. Conforto, Rory A. Cooper, Rosemarie Cooper, Steven C. Cramer, Armin Curt, Mark D’Esposito, Matthew B. Dalva, Gavriel David, Brandon Delia, Wenbin Deng, Volker Dietz, Bruce H. Dobkin, Marco Domeniconi, Edith Durand, Tracey Vause Earland, Georg Ebersbach, Jonathan J. Evans, James W. Fawcett, Uri Feintuch, Toby A. Ferguson, Marie T. Filbin, Diasinou Fioravante, Itzhak Fischer, Agnes Floel, Herta Flor, Karim Fouad, Richard S. J. Frackowiak, Peter H. Gorman, Thomas W. Gould, Jean-Michel Gracies, Amparo Gutierrez, Kurt Haas, C.D. Hall, Hans-Peter Hartung, Zhigang He, Jordan Hecker, Susan J. Herdman, Seth Herman, Leigh R. Hochberg, Ahmet Höke, Fay B. Horak, Jared C. Horvath, Richard L. Huganir, Friedhelm C. Hummel, Beata Jarosiewicz, Frances E. Jensen, Michael Jöbges, Larry M. Jordan, Jon H. Kaas, Andres M. Kanner, Noomi Katz, Matthew S. Kayser, Annmarie Kelleher, Gerd Kempermann, Timothy E. Kennedy, Jürg Kesselring, Fary Khan, Rachel Kizony, Jeffery D. Kocsis, Boudewijn J. Kollen, Hubertus Köller, John W. Krakauer, Hermano I. Krebs, Gert Kwakkel, Bradley Lang, Catherine E. Lang, Helmar C. Lehmann, Angelo C. Lepore, Glenn S. Le Prell, Mindy F. Levin, Joel M. Levine, David A. Low, Marilyn MacKay-Lyons, Jeffrey D. Macklis, Margaret Mak, Francine Malouin, William C. Mann, Paul D. Marasco, Christopher J. Mathias, Laura McClure, Jan Mehrholz, Lorne M. Mendell, Robert H. Miller, Carol Milligan, Beth Mineo, Simon W. Moore, Jennifer Morgan, Charbel E-H. Moussa, Martin Munz, Randolph J. Nudo, Joseph J. Pancrazio, Theresa Pape, Alvaro Pascual-Leone, Kristin M. Pearson-Fuhrhop, P. Hunter Peckham, Tamara L. Pelleshi, Catherine Verrier Piersol, Thomas Platz, Marcus Pohl, Dejan B. Popović, Andrew M. Poulos, Maulik Purohit, Hui-Xin Qi, Debbie Rand, Mahendra S. Rao, Josef P. Rauschecker, Aimee Reiss, Carol L. Richards, Keith M. Robinson, Melvyn Roerdink, John C. Rosenbek, Serge Rossignol, Edward S. Ruthazer, Arash Sahraie, Krishnankutty Sathian, Marc H. Schieber, Brian J. Schmidt, Michael E. Selzer, Mijail D. Serruya, Himanshu Sharma, Michael Shifman, Jerry Silver, Thomas Sinkjær, George M. Smith, Young-Jin Son, Tim Spencer, John D. Steeves, Oswald Steward, Sheela Stuart, Austin J. Sumner, Chin Lik Tan, Robert W. Teasell, Gareth Thomas, Aiko K. Thompson, Richard F. Thompson, Wesley J. Thompson, Erika Timar, Ceri T. Trevethan, Christopher Trimby, Gary R. Turner, Mark H. Tuszynski, Erna A. van Niekerk, Ricardo Viana, Difei Wang, Anthony B. Ward, Nick S. Ward, Stephen G. Waxman, Patrice L. Weiss, Jörg Wissel, Steven L. Wolf, Jonathan R. Wolpaw, Sharon Wood-Dauphinee, Ross D. Zafonte, Binhai Zheng, Richard D. Zorowitz
- Edited by Michael E. Selzer, Stephanie Clarke, Leonardo G. Cohen, Gert Kwakkel, Robert H. Miller, Case Western Reserve University, Ohio
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- Book:
- Textbook of Neural Repair and Rehabilitation
- Published online:
- 05 June 2014
- Print publication:
- 24 April 2014, pp ix-xvi
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Contributors
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- By André Aleman, Narmeen Ammari, Alan Anticevic, Deanna M. Barch, Christopher R. Bowie, Katherine E. Burdick, Sara J. Czaja, Anthony S. David, Colin A. Depp, Dwight Dickinson, Gary Donohoe, Melissa Fisher, Benjamin Glicksberg, Michael F. Green, Maya Gupta, Philip D. Harvey, R. Walter Heinrichs, Katherine Holshausen, William P. Horan, Daniel C. Javitt, Richard Keefe, John H. Krystal, David Loewenstein, Susan R. McGurk, Kristopher I. Mathis, Brent Mausbach, Ashley A. Miles, Kim T. Mueser, Eva Muharib, Robin Murray, Akshay Nair, Rogerio Panizzutti, Thomas Patterson, Amy E. Pinkham, Abraham Reichenberg, Manuela Russo, Jonathan Schaefer, Karuna Subramaniam, Laura Vergel de Dios, Sophia Vinogradov, Daniel R. Weinberger, Jonathan K. Wynn
- Edited by Philip D. Harvey, University of Miami
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- Book:
- Cognitive Impairment in Schizophrenia
- Published online:
- 05 February 2013
- Print publication:
- 24 January 2013, pp vii-x
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List of Contributors
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- By Harold P. Adams, Colum F. Amory, Anne Angelillo-Scherrer, Irena Anselm, Marcel Arnold, Robert W. Baloh, Ralf W. Baumgartner, José Biller, Valérie Biousse, Matthias Bischof, Julien Bogousslavsky, Natan M. Bornstein, Marie Germaine Bousser, Robin L. Brey, John C. M. Brust, Alan Bryer, Olivier Calvetti, Louis R. Caplan, José Castillo, Hugues Chabriat, Chin-Sang Chung, Charlotte Cordonnier, Steven C. Cramer, Luís Cunha, Rima M. Dafer, John F. Dashe, Cyrus K. Dastur, Antonio Dávalos, Larry E. Davis, Patricia Davis, Stephen M. Davis, Jan L. De Bleecker, Michael A. De Georgia, Amir R. Dehdashti, Oscar H. Del Brutto, Jacques L. De Reuck, Hans-Christoph Diener, Kathleen B. Digre, Vivian U. Fritz, Nancy Futrell, Bhuwan P. Garg, Philip B. Gorelick, Glenn D. Graham, Alexander Y. Gur, John J. Halperin, Michael Hennerici, Isabel Lestro Henriques, Roberto C. Heros, Daniel B. Hier, Lorenz Hirt, Joanna C. Jen, Taro Kaibara, Sumit Kapoor, Sarosh M. Katrak, Siddharth Kharkar, Walter J. Koroshetz, Monisha Kumar, Sandeep Kumar, Emre Kumral, Tobias Kurth, Rogelio Leira, Steven R. Levine, Didier Leys, Doris Lin, Jonathan Lipton, Alfredo M. Lopez-Yunez, Betsy B. Love, Ayrton Roberto Massaro, Heinrich P. Mattle, Manu Mehdiratta, John H. Menkes, Philippe Metellus, Reto Meuli, Patrik Michel, Panayiotis Mitsias, Jorge Moncayo-Gaete, Julien Morier, Krassen Nedeltchev, Bernhard Neundörfer, Olukemi A. Olugemo, Nikolaos I. H. Papamitsakis, Stephen D. Reck, Luca Regli, Marc D. Reichhart, Daniele Rigamonti, Michael J. Rivkin, E. Steve Roach, Jose F. Roldan, David Z. Rose, Daniel M. Rosenbaum, N. Paul Rosman, Elayna O. Rubens, Sean I. Savitz, Marc Schapira, Robert J. Schwartzman, Magdy Selim, Yukito Shinohara, Aneesh B. Singhal, Michael A. Sloan, Barney J. Stern, Mathias Sturzenegger, Oriana Thompson, A. Wesley Thevathasan, Jonathan D. Trobe, Michael Varner, Dana Védy, Jorge Vidaurre, Engin Y. Yilmaz, Khaled Zamel, Mathieu Zuber
- Edited by Louis R. Caplan, Julien Bogousslavsky
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- Book:
- Uncommon Causes of Stroke
- Published online:
- 06 January 2010
- Print publication:
- 09 October 2008, pp ix-xiv
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The Electrical and Optical Properties of GaAs with as Precipitates (GaAs:As)
- A. C. Warren, J. M. Woodall, J. H. Burroughes, P. D. Kirchner, H. K. Heinrich, G. Arjavalingam, N. Katzenellenbogen, D. Grischkowsky, M. R. Melloch, N. Otsuka, K. Mahalingam, F. H. Pollak, X. Yin
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- Journal:
- MRS Online Proceedings Library Archive / Volume 241 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 15
- Print publication:
- 1991
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Since its initial report by the IBM/Purdue University group in 1990, GaAs with As precipitates (GaAs:As) has been shown by this group to exhibit unusual and useful electrical and optical properties. In this paper we review our progress in understanding the fundamental properties of this material. We have shown that both the electrical and optical properties of GaAs:As arc explained by assuming that the GaAs is of good crystalline quality and that the As precipitates act as buried Schottky barriers. This model accounts for its semi-insulating stability against both n- and p-type doping, its high-speed photoconductive behavior, and its ability to detect 1.3 micron light when it forms the “I” layer of a PIN photodiode via the internal photoemission process. Using modulation spectroscopy we clarify the fundamental differences between GaAs:As and unannealed GaAs grown at 200 C. We also show that GaAs:As used as a 1.3 micron detector in the metal-semiconductor-metal device structure format, has a photoconductive bandwidth in excess of 50 GHz.
In-Situ Techniques for Studying Epitaxially Grown Layers and Determining their Magnetic Properties
- B. Heinrich, A. S. Arrott, J. F. Cochran, K. B. Urquhart, K. Myrtle, Z. Celinski, Q. M. Zhong
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- Journal:
- MRS Online Proceedings Library Archive / Volume 151 / 1989
- Published online by Cambridge University Press:
- 03 September 2012, 177
- Print publication:
- 1989
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Ultrathin films of bcc Fe (001) on Ag (001) and Fe/Ni (001) bilayers on Ag were grown by molecular beam epitaxy. A wide range of surface science tools (RHEED, REELFS, AES, and XPS) were employed to establish the quality of epitaxial growth. Ferromagnetic resonance and Brillouin light scattering were used to extract the magnetic properties. Emphasis was placed on the study of magnetic anisotropies. Large uniaxial anisotropies with the easy axis perpendicular to the film surface were observed in all ultrathin structures studied. In sufficiently thin samples the saturation magnetization was oriented perpendicular to the film surface in the absence of an applied field. It has been demonstrated that in bcc Fe films the uniaxial perpendicular anisotropy originates at the film interfaces. Fe/Ni bilayers were also investigated. Ni grows in the pure bcc structure for the first 3–6ML and then transforms to a new structure which exhibits unique magnetic properties. Transformed ultrathin bilayers possesses large in-plane 4th order anisotropies far surpassing those observed in bulk Fe and Ni. The large 4th order anisotropies originate in crystallographic defects formed during the Ni lattice transformation.
Empirical Approaches for the Treatment of Interelement Effects
- K. F. J. Heinrich
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- Journal:
- Advances in X-ray Analysis / Volume 19 / 1975
- Published online by Cambridge University Press:
- 06 March 2019, pp. 75-84
- Print publication:
- 1975
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Empirical algorithms for the treatment of interelement effects in x-ray fluorescence spectrometry are reviewed. It is recommended that the effects of tertiary x-ray emission be treated separately from those of x-ray absorption, and that standard reference materials of composition close to that of the specimen be used.
X-Ray Fluorescence Analysis of High-Temperature Super Alloys — Calibration and Standards
- K. F. J. Heinrich, S. D. Rasberry
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- Journal:
- Advances in X-ray Analysis / Volume 17 / 1973
- Published online by Cambridge University Press:
- 06 March 2019, pp. 309-317
- Print publication:
- 1973
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The current experimental work extends our calibration concept of separating the effects of absorption and fluorescence to the high - temperature superalloys. The new calibration procedure produces calibration equations which are valid over wide ranges of composition — a feature which is useful in the analysis of high - temperature superalloys . For the specimens considered, the elements iron, nickel, chromium, cobalt and molybdenum can be present at levels greater than 10%; while tantalum, aluminum, titanium, manganese, silicon and vanadium may be present at levels between 1 and 6%. The calibration for this group of alloys has required, in the past, a large number of standards; the number is reduced by judicious application of the given correction equations. Analytical errors can be limited to 1 to 2% in the use of this method.
Homogeneity Characterization of NBS Spectrometric Standards II: Cartridge Brass and Low-Alloy Steel*
- H. Yakowitz, D. L. Vieth, K. F. J. Heinrich, R. E. Michaelis
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- Journal:
- Advances in X-ray Analysis / Volume 9 / 1965
- Published online by Cambridge University Press:
- 06 March 2019, pp. 289-303
- Print publication:
- 1965
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Most modern instrumental methods of analysis depend on the use of known standards of composition for calibration. Newer analytical techniques, such as the solids mass spectrometer, laser probe and, especially, the electron-probe microanalyzer have reduced the amount of a sample which can be analyzed quantitatively to a range of about 0.1 to as small as 0.00005 μg. As a corollary to these microanalytical advances, homogeneity requirements have become severe to meet analytical standards. This paper describes a continuation of the National Bureau of Standards' effort to characterize more fully existing standards as to suitability for the new microanalytical techniques. An NBS cartridge brass sample in both the wrought (NBS-1102) and chill cast forms (NBS-C1102), as well as a low-alloy steel sample (NBS-463), have been investigated by means of electron-probe micreanalysis and optical metallography. Some 17 elements are contained in the brass, while 25 elements are found in the steel. Results for 10 elements in the steel and 6 elements in the brass are presented. In the steel, iron, nickel, copper, and silicon ate essentially distributed homogeneously at micron levels, while manganese, tantalum, niobium, zirconium, sulfur, and chromium are not. In the brass, copper and zinc are distributed homogeneously at micron levels while lead, sulfur, aluminum, and silicon are not. Electron-probe micreanalyzer results indicate that both NBS-1102 and NBS-C1102 brass are suitable for use as a calibration standard for electronprobe microanalysis as well as other microsnalyticat techniques, such as the solids mass spectrometer. The results for brass have been corroborated by a number of laboratories using the electron-probe analyzer.