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Ultra High Energy Resolution EELS Map Employing an Aberration-corrected STEM Equipped with a Monochromator
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1126-1127
- Print publication:
- August 2013
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Practical Remote Electron Microscopy - A Vendor's Perspective
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 868-869
- Print publication:
- July 2011
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