5 results
Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1118-1119
- Print publication:
- August 2018
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Correlative t-EBSD Tomography and Atom Probe Tomography Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 682-683
- Print publication:
- July 2016
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Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 687-688
- Print publication:
- August 2015
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New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 696-697
- Print publication:
- August 2013
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Zeeman splittings of the 5D0–7F2 transitions of Eu3+ ions implanted into GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1290 / 2011
- Published online by Cambridge University Press:
- 02 March 2011, mrsf10-1290-i03-06
- Print publication:
- 2011
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