3 results
Picosecond time-resolved X-ray diffraction from laser-shocked semiconductors
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- Journal:
- Laser and Particle Beams / Volume 22 / Issue 3 / July 2004
- Published online by Cambridge University Press:
- 01 July 2004, pp. 285-288
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- Article
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Subsurface Damage Characterization of Hydrogen Ion Implanted Silicon Wafer with Uv/Millimeter-Wave Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 631 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, AA1.8
- Print publication:
- 2000
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- Article
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Subsurface Damage Profile Characterization of Si Wafers with Uv/Millimeter-Wave Technique and Light Scattering Topography
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- Journal:
- MRS Online Proceedings Library Archive / Volume 631 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, AA1.9
- Print publication:
- 2000
-
- Article
- Export citation